AFM Bruker – Dimension Icon

The AFM Bruker Dimension Icon is the newest development of Bruker’s nanoscale imaging and characterization technologies.

The Dimension Icon uses a large sample, tip-scanning AFM platform and includes sensors that compensate for temperature and noise rendering levels in the sub-angstroms range for the Z-axis, and angstroms in X-Y. 

Download the AFM Bruker – Dimension Icon Brochure (PDF version, 1,326 KB)