Ellipsometer – Horiba UVISEL FUV-NIR
Description
The UVISEL scanning spectroscopic ellipsometer covers a range from FUV to NIR (255 to 2100 nanometers in wavelength) for thin film characterizations
This includes thin to thick layers, with or without a transparent substrate, in the fields of semiconductors, flat panel displays, optoelectronics, photovoltaics, and optical and functional coatings
Download the Ellipsometer – Horiba UVISEL FUV-NIR Brochure (PDF version, 2,014 KB)