The facility provides sample analysis via single crystal x-ray diffraction (SCXRD), powder x-ray diffraction (PXRD) and x-ray fluorescence (XRF). The three techniques are complementary and are routinely used by material scientists, chemists, biochemists, physicists, geologists, mineralogists, and engineers.

Sample submission

Diffractometer Status:

  • KAPPA – Operational
  • SMART – Not operational

Important terms of use

  • Please DO NOT bring samples to the x-ray manager until he requests them. He will do so when you are next in line in the queue. When requested, air stable samples may be left on the sample drop-off cart outside the lab. Air sensitive samples must be handed off to a member of the XRCF staff by appointment. 
  • Please contact the x-ray manager for instructions on how to prepare AIR SENSITIVE samples.
  • All samples submitted for analysis by XRCF staff MUST BE RETRIEVED within 14 days of analysis or they will be discarded, potentially incurring additional expenses.

Please read the entire terms of use page before submitting your request. 

Fees:

  • uOttawa clients and users: $200 per dataset (includes full solution and publication support; annual cap: $5000 per research group)
  • Clients from other academic institutes: $350 per dataset (includes full solution and publication support, if desired)
  • Clients from non-academic sources: contact facility for pricing
  • User training (uOttawa users only): $300 per user (not counted toward annual cap)

Contact us

X-ray Core Facility

tel. (613) 562-5800 ext. 6664
STEM Complex, room 028A
University of Ottawa
150 Louis Pasteur
Ottawa, ON, Canada, K1N 6N5

Dr. Jeff Ovens

tel. (613) 562-5800 ext. 1488
[email protected]
office: STM 405